Reducing serial I/O power in error-tolerant applications by efficient lossy encoding
Name
Rinard_Reducing serial.pdf
Size
9.55 MB
Format
Adobe PDF
Checksum (MD5)
9efbf7c7982a4c8e1cab318086e70260
Author(s)
Stanley-Marbell, Phillip
Rinard, Martin C
Date Issued
June 2016
Journal
Proceedings of the 53rd Annual Design Automation Conference on - DAC '16
Publisher
Association for Computing Machinery
Citation
Stanley-Marbell, Phillip, and Martin Rinard. "Reducing Serial I/O Power in Error-Tolerant Applications by Efficient Lossy Encoding." Proceedings of the 53rd Annual Design Automation Conference on - DAC '16, 5-9 June 2015, Austin, Texas, ACM Press, 2016, pp. 1–6
Version
Author's final manuscript
Abstract
Transferring data between integrated circuits (ICs) accounts for an important fraction of the power dissipation in wearable and mobile systems. Reducing signal transitions reduces the dynamic power dissipated in the data transfer between ICs. Techniques such as Gray coding to reduce transitions between two parallel words cannot be applied when the signal transitions are between bits of a single serialized word.
This paper introduces value-deviation-bounded serial encoding (VDBS encoding). VDBS encoding significantly reduces signal transitions between bits of a single serialized word, trading power efficiency for data accuracy. This tradeoff is worthwhile when the data are from signal sources such as sensors and destined for consumption by signal processing algorithms that are error-tolerant.
We present analytic formulas for the Pareto-optimal VDBS encoders and introduce an efficient algorithm, Rake, that reduces transitions almost as much as the optimum transition-reducing encoder. We evaluate Rake by encoding data in a pedometer system and in a text-recognition system. For the pedometer, Rake reduces transitions by 54% on average, in exchange for step count errors smaller than 5%. For the text recognizer, Rake reduces transitions by 55% on average, while maintaining OCR accuracy above 90 %.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
Creative Commons Attribution-Noncommercial-Share Alike
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1145/2897937.2898079
