Inelastic x-ray scattering measurements of phonon dynamics in URu[subscript 2] Si[subscript 2]
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PhysRevB.93.075123.pdf
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Author(s)
Said, A. H.
Leu, B. M.
Williams, T. J.
Luke, G. M.
Gardner, Dillon R.
Bonnoit, Craig J.
Chisnell, Robin
Lee, Young S.
Date Issued
February 2016
Journal
Physical Review B
Publisher
American Physical Society
Citation
Gardner, D. R., C. J. Bonnoit, R. Chisnell, A. H. Said, B. M. Leu, T. J. Williams, G. M. Luke, and Y. S. Lee. “Inelastic x-Ray Scattering Measurements of Phonon Dynamics in URu[subscript 2] Si[subscript 2].” Physical Review B 93, no. 7 (February 11, 2016). © 2016 American Physical Society
Version
Final published version
Abstract
We report high-resolution inelastic x-ray scattering measurements of the acoustic phonons of URu[subscript 2] Si[subscript 2]. At all temperatures, the longitudinal acoustic phonon linewidths are anomalously broad at small wave vectors revealing a previously unknown anharmonicity. The phonon modes do not change significantly upon cooling into the hidden order phase. Our data suggest that the increase in thermal conductivity in the hidden order phase cannot be driven by a change in phonon dispersions or lifetimes. Hence, the phonon contribution to the thermal conductivity is likely much less significant compared to that of the magnetic excitations in the low temperature phase.
MIT Department
Massachusetts Institute of Technology. Department of Physics
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DOI of Published Version
https://doi.org/10.1103/PhysRevB.93.075123
