Repository logo
Log in(current)
Repository logoMIT Open ScholarshipDSpace@MIT
  1. Home
  2. MIT Open Access Articles
  3. MIT Open Access Articles
  4. Investigation of possible microcavity effect on lasing threshold of nonradiative-scattering-dominated semiconductor lasers

Investigation of possible microcavity effect on lasing threshold of nonradiative-scattering-dominated semiconductor lasers

Thumbnail Image
Download
Name

Hu_Investigation of possible.pdf

Size

233.99 KB

Format

Adobe PDF

Checksum (MD5)

105fec3cc63f052cd59457bfa2c7f734

Author(s)
Kumar, Sushil
•
Hu, Qing
Date Issued
January 2012
Journal
Applied Physics Letters
Publisher
American Institute of Physics (AIP)
Citation
Kumar, Sushil, and Qing Hu. “Investigation of Possible Microcavity Effect on Lasing Threshold of Nonradiative-Scattering-Dominated Semiconductor Lasers.” Appl. Phys. Lett. 100, no. 4 (2012): 041105. © 2012 American Institute of Physics
Version
Final published version
Abstract
The effect of enhanced rate of spontaneous emission on gain and lasing threshold of semiconductor microcavity lasers has not been discussed clearly. Some reports have suggested that the lasing threshold in microcavities could possibly be lowered due to the so-called Purcell effect. Here, we argue that gain in weakly coupled semiconductor cavities is a local phenomenon, which occurs due to stimulated emission induced by an electromagnetic excitation and remains unaffected by the cavityboundary conditions. Hence, the Purcell effect in microcavities filled uniformly with a gain medium should not lead to a reduction in the laser’s threshold pump density, provided radiative scattering is not the dominant relaxation mechanism in the excited state. A systematic experimental investigation of laser threshold in parallel-plate semiconductor microcavity terahertz quantum-cascade lasers of different dimensions was found to be in accordance with our arguments.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Research Laboratory of Electronics
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
http://hdl.handle.net/1721.1/86342
DOI of Published Version
https://doi.org/10.1063/1.3678595
Repository logo
PrivacyPermissionsAccessibilityContact us
Repository logo
Notify us about copyright concerns.