Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2]
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Tisdale_Reduced dielectric.pdf
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Author(s)
Prins, Ferry
Tisdale, William A.
Goodman, Aaron Jacob
Date Issued
October 2014
Journal
Nano Letters
Publisher
American Chemical Society (ACS)
Citation
Prins, Ferry, Aaron J. Goodman, and William A. Tisdale. “Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2].” Nano Lett. 14, no. 11 (November 12, 2014): 6087–6091.
Version
Original manuscript
Abstract
We report highly efficient nonradiative energy transfer from cadmium selenide (CdSe) quantum dots to monolayer and few-layer molybdenum disulfide (MoS[subscript 2]). The quenching of the donor quantum dot photoluminescence increases as the MoS[subscript 2] flake thickness decreases with the highest efficiency (>95%) observed for monolayer MoS[subscript 2]. This counterintuitive result arises from reduced dielectric screening in thin layer semiconductors having unusually large permittivity and a strong in-plane transition dipole moment, as found in MoS[subscript 2]. Excitonic energy transfer between a zero-dimensional emitter and a two-dimensional absorber is fundamentally interesting and enables a wide range of applications including broadband optical down-conversion, optical detection, photovoltaic sensitization, and color shifting in light-emitting devices.
MIT Department
Massachusetts Institute of Technology. Department of Chemical Engineering
Massachusetts Institute of Technology. Department of Chemistry
Massachusetts Institute of Technology. Research Laboratory of Electronics
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1021/nl5019386
