Application of Precision Successive-approximation-register
Analog-to-digital Converters for Digital Root-mean-square
Calculation
Name
choi-sunchoi-meng-eecs-2025-thesis.pdf
Description
Thesis PDF
Size
5.03 MB
Format
Adobe PDF
Checksum (MD5)
4c254971fb89d341193f070ea080f515
Author(s)
Choi, Sun Mee
Advisor(s)
Schmitt, Tyler
Alizadeh, Mohammad
Date Issued
May 2025
Publisher
Massachusetts Institute of Technology
Abstract
The advancement of semiconductor manufacturing processes has allowed for the availability of powerful microcontrollers at lower costs, granting system designers the flexibility to select between analog and digital signal processing techniques. Enabled by recent developments in low-power successive approximation register (SAR) analog-to-digital converter (ADC) technology, a digital approach to root-mean-square (RMS) measurement is proposed. The work begins with an explicit accumulation and averaging approach, and a set of improvements were designed to increase measurement accuracy and reliability. Algorithms are compared using the metrics of error, power efficiency, latency, and digital overhead. High-performing and power-efficient digital RMS measurement methods could be valuable for decentralized instrumentation systems such as smart grids and factory automation where long-lasting handheld and portable solutions are becoming critical.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
In Copyright - Educational Use Permitted
Copyright retained by author(s)
Persistent DSpace Link
