Highlighted depth-of-field photography: Shining light on focus
Name
Raskar_Highlighted Depth.pdf
Size
26.06 MB
Format
Adobe PDF
Checksum (MD5)
8b3a251359e68b9c762fac5c8203097b
Author(s)
Kim, Jaewon
Horstmeyer, Roarke William
Kim, Ig-Jae
Raskar, Ramesh
Date Issued
May 2011
Journal
ACM transactions on graphics
Publisher
Association for Computing Machinery
Citation
Kim, Jaewon et al. “Highlighted depth-of-field photography: shining light on focus.” ACM Transactions on Graphics 30, 3, (May 2011): 1-9. Copyright © 2011, Association for Computing Machinery, Inc.
Version
Author's final manuscript
Abstract
We present a photographic method to enhance intensity differences between
objects at varying distances from the focal plane. By combining a unique
capture procedure with simple image processing techniques, the detected
brightness of an object is decreased proportional to its degree of defocus. A
camera-projector system casts distinct grid patterns onto a scene to generate
a spatial distribution of point reflections. These point reflections relay a
relative measure of defocus that is utilized in postprocessing to generate a
highlighted DOF photograph. Trade-offs between three different projectorprocessing
pairs are analyzed, and a model is developed to help describe a
new intensity-dependent depth of field that is controlled by the pattern of
illumination. Results are presented for a primary single snapshot design as
well as a scanning method and a comparison method. As an application,
automatic matting results are presented.
MIT Department
Massachusetts Institute of Technology. Media Laboratory
Program in Media Arts and Sciences (Massachusetts Institute of Technology)
Terms of Use
Creative Commons Attribution-Noncommercial-Share Alike 3.0
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1145/1966394.1966403
