Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes
Name
48862861-MIT.pdf
Description
Full printable version
Size
4.98 MB
Format
Adobe PDF
Checksum (MD5)
dd4d4128ebead66900713ece560e322b
Author(s)
Howe, Jonathan E. (Jonathan Emerson), 1973-
Advisor(s)
Stephen C. Graves and Stanley B. Gershwin.
Date Issued
2001
Publisher
Massachusetts Institute of Technology
Description
Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001.
Includes bibliographical references (p. 73).
Subjects
Sloan School of Management.
Mechanical Engineering.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Sloan School of Management
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