Fabrication Process Yielding Saturated Nanowire Single-Photon Detectors With 24-Picosecond Jitter
Name
Saturated-Low-Jitter-SNSPD_v11_IEEE_format.pdf
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1.74 MB
Format
Adobe PDF
Checksum (MD5)
97c2315cb584149f666e5df303409786
Author(s)
Najafi, Faraz
Bellei, Francesco
Zhao, Qingyuan
Sunter, Kristen A.
McCaughan, Adam N.
Berggren, Karl K.
Dane, Andrew Edward
Alternative Title
Fabrication Process Yielding Saturated Nanowire Single-Photon Detectors With 24-ps Jitter
Date Issued
March 2015
Journal
IEEE Journal of Selected Topics in Quantum Electronics
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Najafi, Faraz, Andrew Dane, Francesco Bellei, Qingyuan Zhao, Kristen A. Sunter, Adam N. McCaughan, and Karl K. Berggren. “Fabrication Process Yielding Saturated Nanowire Single-Photon Detectors With 24-Ps Jitter.” IEEE Journal of Selected Topics in Quantum Electronics 21, no. 2 (March 2015): 1–7.
Version
Author's final manuscript
Abstract
We present an optimized fabrication process for superconducting nanowire single-photon detectors that allowed us to obtain a yield of ~70% for detectors based on 80-nm-wide niobium nitride nanowires. We fabricated detectors that showed 24-ps timing jitter and saturated detection efficiency without the need for cryogenic amplifiers, allowing for operation in a low-bias low-dark-count-rate regime while operating at maximum detection efficiency.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Research Laboratory of Electronics
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Creative Commons Attribution-Noncommercial-Share Alike
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1109/JSTQE.2014.2372054
