Determining Interface Dielectric Losses in Superconducting Coplanar-Waveguide Resonators
Name
PhysRevApplied.12.014012.pdf
Description
Published version
Size
1.42 MB
Format
Adobe PDF
Checksum (MD5)
aa57e814748a684f566edb9c38733b06
Author(s)
Woods, W
Calusine, G
Melville, A
Sevi, A
Golden, E
Kim, DK
Rosenberg, D
Yoder, JL
Oliver, WD
Date Issued
2019
Journal
Physical Review Applied
Publisher
American Physical Society (APS)
Version
Final published version
Abstract
© 2019 American Physical Society. Superconducting quantum-computing architectures comprise resonators and qubits that experience energy loss due to two-level systems (TLSs) in bulk and interfacial dielectrics. An understanding of these losses is critical to improving performance in superconducting circuits. In this work, we present a method for quantifying the TLS losses of different bulk and interfacial dielectrics present in superconducting coplanar-waveguide (CPW) resonators. By combining statistical characterization of sets of specifically designed CPW resonators on isotropically etched silicon substrates with detailed electromagnetic modeling, we determine the separate loss contributions from individual material interfaces and bulk dielectrics. This technique for analyzing interfacial TLS losses can be used to guide targeted improvements to qubits, resonators, and their superconducting fabrication processes.
MIT Department
Lincoln Laboratory
Massachusetts Institute of Technology. Research Laboratory of Electronics
Massachusetts Institute of Technology. Department of Physics
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1103/PHYSREVAPPLIED.12.014012
