Self-referenced quantitative phase microscopy
Name
82271S.pdf
Size
711.63 KB
Format
Adobe PDF
Checksum (MD5)
19571ea007a39c790ca43e3e58a743a7
Author(s)
Hillman, Timothy Robert
Lue, Niyom
Sung, Yongjin
Dasari, Ramachandra Rao
So, Peter T. C.
Yaqoob, Zahid
Date Issued
February 2012
Publisher
SPIE-Intl Soc Optical Eng
Citation
Hillman, Timothy R., Niyom Lue, Yongjin Sung, Ramachandra R. Dasari, Peter T. C. So, and Zahid Yaqoob. “Self-Referenced Quantitative Phase Microscopy.” Edited by Jose-Angel Conchello, Carol J. Cogswell, Tony Wilson, and Thomas G. Brown. Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX (February 9, 2012).
Version
Final published version
Abstract
Self-referenced quantitative phase microscopy (SrQPM) is reported, wherein quantitative phase imaging is achieved through the interference of the sample wave with a reflected version of itself. The off-axis interference between the two beams generates a spatially modulated hologram that is analyzed to quantify the sample's amplitude and phase profile. SrQPM requires approximately one-half of the object field of view to be empty and optically flat, which serves as a reference for the other half of the field of view containing the sample.
MIT Department
Lincoln Laboratory
Massachusetts Institute of Technology. Department of Biological Engineering
Massachusetts Institute of Technology. Department of Chemistry
Massachusetts Institute of Technology. Department of Mechanical Engineering
Massachusetts Institute of Technology. Spectroscopy Laboratory
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1117/12.909701
