Imaging resonant dissipation from individual atomic defects in graphene
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1710.01486.pdf
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5.12 MB
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Author(s)
Halbertal, Dorri
Ben Shalom, Moshe
Uri, Aviram
Bagani, Kousik
Meltzer, Alexander Y.
Marcus, Ido
Myasoedov, Yuri
Birkbeck, John
Levitov, Leonid
Geim, Andre K.
Date Issued
December 2017
Journal
Science
Publisher
American Association for the Advancement of Science (AAAS)
Citation
Halbertal, Dorri et al. “Imaging Resonant Dissipation from Individual Atomic Defects in Graphene.” Science 358, 6368 (December 2017): 1303–1306. © 2017 American Association for the Advancement of Science
Version
Original manuscript
Abstract
Conversion of electric current into heat involves microscopic processes that operate on nanometer length scales and release minute amounts of power. Although central to our understanding of the electrical properties of materials, individual mediators of energy dissipation have so far eluded direct observation. Using scanning nanothermometry with submicrokelvin sensitivity, we visualized and controlled phonon emission from individual atomic-scale defects in graphene. The inferred electron-phonon “cooling power spectrum” exhibits sharp peaks when the Fermi level comes into resonance with electronic quasi-bound states at such defects. Rare in the bulk but abundant at graphene’s edges, switchable atomic-scale phonon emitters provide the dominant dissipation mechanism. Our work offers insights for addressing key materials challenges in modern electronics and enables control of dissipation at the nanoscale.
MIT Department
Massachusetts Institute of Technology. Department of Physics
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1126/SCIENCE.AAN0877
