Transplanting assembly of carbon-nanotube-tipped atomic force microscope probes
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APPLAB9419193102_1.pdf
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Author(s)
Soohyung, Kim
Lee, Hyung Woo
Kim, Sang-Gook
Date Issued
May 2009
Journal
Applied Physics Letters
Publisher
American Institute of Physics
Citation
Kim, Soohyung, Hyung Woo Lee, and Sang-Gook Kim. “Transplanting Assembly of Carbon-nanotube-tipped Atomic Force Microscope Probes.” Applied Physics Letters 94.19 (2009): 193102. Web.
Version
Final published version
Abstract
Carbon-nanotube (CNT)-tipped atomic force microscope (AFM) probes were assembled in a deterministic and reproducible manner by transplanting a CNT bearing polymeric carrier to a microelectromechanical systems cantilever. Single-strand CNTs were grown vertically at predefined locations where each CNT was encapsulated into a cylindrical polymer carrier block. Double-layer carriers were used for controlling the release of blocks and the exposed length of CNT tips after the assembly. Much reduced complexity in assembly was achieved by transplanting individual CNTs to AFM probes, which could scan nanotrenches and biostructures with little probe artifacts.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1063/1.3136762
