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An x-ray method for measuring the thickness of thin crystalline films

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RLE-TR-017-14261894.pdf

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02b2ed1a6372e7f1649685d9a4ca7558

Date Issued
1946
Publisher
Research Laboratory of Electronics, Massachusetts Institute of Technology
Series/Report no.
Technical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 17.
Description
"Reprinted from Journal of applied physics, vol. 17, No. 11, 874-878, November, 1946."
Includes bibliographical references.
MIT Department
Massachusetts Institute of Technology. Research Laboratory of Electronics
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