An x-ray method for measuring the thickness of thin crystalline films

Name

RLE-TR-017-14261894.pdf

Size

476.02 KB

Format

Adobe PDF

Checksum (MD5)

02b2ed1a6372e7f1649685d9a4ca7558

Date Issued

1946

Publisher

Research Laboratory of Electronics, Massachusetts Institute of Technology

Series/Report no.

Technical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 17.

Description

"Reprinted from Journal of applied physics, vol. 17, No. 11, 874-878, November, 1946."

Includes bibliographical references.

MIT Department

Massachusetts Institute of Technology. Research Laboratory of Electronics

Persistent DSpace Link