Toward the measurement of reliable grain-boundary diffusion coefficients in oxides
Name
34224016-MIT.pdf
Description
Full printable version
Size
14.9 MB
Format
Adobe PDF
Checksum (MD5)
0870ec158a0d1c54f46b89e22e305621
Author(s)
Chung, Yong-Chae
Advisor(s)
Bernhardt J. Wuensch.
Date Issued
1995
Publisher
Massachusetts Institute of Technology
Description
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995.
Includes bibliographical references (leaves 221-231).
Subjects
Materials Science and Engineering
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Terms of Use
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