Direct and quantitative broadband absorptance spectroscopy on small objects using Fourier transform infrared spectrometer and bilayer cantilever probes
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Chen_Direct and quantitative.pdf
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Author(s)
Hsu, Wei-Chun
Tong, Jonathan K.
Liao, Bolin
Burg, Brian R.
Chen, Gang
Date Issued
February 2013
Journal
Applied Physics Letters
Publisher
American Institute of Physics
Citation
Hsu, Wei-Chun et al. “Direct and Quantitative Broadband Absorptance Spectroscopy on Small Objects Using Fourier Transform Infrared Spectrometer and Bilayer Cantilever Probes.” Applied Physics Letters 102.5 (2013): 051901. CrossRef. Web. © 2013 American Institute of Physics.
Version
Final published version
Abstract
A measurement platform is introduced that combines a bilayer cantilever probe with a Fourier transform infrared spectrometer to measure absolute spectral absorptance between wavelengths of 3 μm and 18 μm directly and quantitatively. The enhanced sensitivity provided by the cantilever probe enables the quantitative characterization of micro- and nanometer-sized samples. Validation of the technique is carried out by measuring the absorptance spectrum of a doped silicon thin film with a backside aluminum layer and found to agree well with the theoretical predictions. The presented technique is especially attractive for samples such as individual nanowires or nanoparticles, isolated molecules, powders, and photonic structures.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1063/1.4790184
