Thermal annealing effects on boron-implanted HgCdTe diodes
Name
18720614-MIT.pdf
Size
29.43 MB
Format
Adobe PDF
Checksum (MD5)
db45ab161cc59bc64b20818fdcf795bd
Author(s)
Syz, Jing-Kai.
Advisor(s)
Robert H. Kingston.
Date Issued
1988
Publisher
Massachusetts Institute of Technology
Description
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988.
Vita.
Bibliography: leaves 114-117.
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.
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