Statistical usage models in mobile processor thermal design and testing
Name
53362268-MIT.pdf
Description
Full printable version
Size
8.04 MB
Format
Adobe PDF
Checksum (MD5)
6fcbd77007158c7f0a82168f317d708d
Author(s)
Evans, Thomas C. (Thomas Carl), 1971-
Advisor(s)
Daniel E. Whitney and Roy E. Welsch.
Alternative Title
Statistical usage models in mobile microprocessor thermal design and testing
Date Issued
2003
Publisher
Massachusetts Institute of Technology
Description
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; in conjunction with the Leaders for Manufacturing Program at MIT, 2003.
Includes bibliographical references (p. 77).
Subjects
Mechanical Engineering.
Sloan School of Management.
Leaders for Manufacturing Program.
MIT Department
Leaders for Manufacturing Program at MIT
Massachusetts Institute of Technology. Department of Mechanical Engineering
Sloan School of Management
Terms of Use
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