Java remote microscope for collaborative inspection of integrated circuits
Name
38529409-MIT.pdf
Description
Full printable version
Size
41.94 MB
Format
Adobe PDF
Checksum (MD5)
566dfe96322e3cb5ab7434c055c911d8
Author(s)
Perez, Manuel Joseph
Advisor(s)
Donald E. Troxel.
Date Issued
1997
Publisher
Massachusetts Institute of Technology
Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1997.
Includes bibliographical references (leaf 89).
Subjects
Electrical Engineering and Computer Science
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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reproduction or distribution in any format is prohibited without written
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