A digital technique for precise measurement of capacitor differences, with application to capacitive integrated sensors
Name
17455811-MIT.pdf
Description
Full printable version
Size
4.22 MB
Format
Adobe PDF
Checksum (MD5)
9bf6e7390b84587c0e8e5c447bac1386
Author(s)
Kung, Joseph T. (Joseph Tze-Shew)
Advisor(s)
Hae-Seung Lee and Roger T. Howe.
Date Issued
1987
Publisher
Massachusetts Institute of Technology
Description
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1987.
Bibliography: p. 107-113.
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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