Experimental Design for Voltage Driven Tracer Incorporation and Diffusion Studies on Oxide Thin Film Electrodes
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J. Electrochem. Soc.-2017-Huber-F809-14.pdf
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Author(s)
Navickas, Edvinas
Sasaki, Kazunari
Friedbacher, Gernot
Hutter, Herbert
Fleig, Juergen
Huber, Tobias
Yildiz, Bilge
Tuller, Harry L.
Date Issued
May 2017
Journal
Journal of The Electrochemical Society
Publisher
The Electrochemical Society
Citation
Huber, Tobias M., Edvinas Navickas, Kazunari Sasaki, Bilge Yildiz, Harry Tuller, Gernot Friedbacher, Herbert Hutter, and Juergen Fleig. “Experimental Design for Voltage Driven Tracer Incorporation and Diffusion Studies on Oxide Thin Film Electrodes.” Journal of The Electrochemical Society 164, no. 7 (2017): F809–F814.
Version
Final published version
Abstract
The effect of an applied overpotential on oxygen isotope incorporation and diffusion in oxide thin film electrodes is investigated by a novel experimental approach. A special electrode geometry leads to in-plane electron flow, perpendicular oxide ion flow and a well-defined laterally varying driving force. This design allows one to obtain a series of tracer depth profiles induced by a range of overpotentials on one and the same thin film. The approach was applied to La0.8Sr0.2MnO3(LSM) thin films deposited by pulsed laser deposition (PLD) on yttria stabilized zirconia (YSZ) single crystals. Tracer depth profiles were measured by secondary ion mass spectrometry (SIMS). These depth profiles include examples of pronounced apparent uphill diffusion that can be explained by considering an interplay of polarization-induced changes in stoichiometry within the LSM grains combined with fast oxygen transport along the grain boundaries.
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
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Creative Commons Attribution 4.0 International License
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DOI of Published Version
https://doi.org/10.1149/2.0711707JES
