On the methodology of assessing hot-carrier reliability of analog circuits
Name
47078390-MIT.pdf
Description
Full printable version
Size
6.41 MB
Format
Adobe PDF
Checksum (MD5)
94695d6e3001f498f90d5e235d249aae
Author(s)
Le, Huy X. P
Advisor(s)
James E. Chung and Paul J. Marcoux.
Date Issued
1999
Publisher
Massachusetts Institute of Technology
Description
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.
Includes bibliographical references (leaves 112-116).
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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