Reactivity of Perovskites with Water: Role of Hydroxylation in Wetting and Implications for Oxygen Electrocatalysis
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Water_LaMO3_JPCC_vf.pdf
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Checksum (MD5)
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Author(s)
Biegalski, Michael D.
Bluhm, Hendrik
Stoerzinger, Kelsey Ann
Hong, Wesley Terrence
Azimi, Gisele
Giordano, Livia
Lee, Yueh Lin
Crumlin, Ethan J
Varanasi, Kripa
Shao-Horn, Yang
Date Issued
July 2015
Journal
The Journal of Physical Chemistry C
Publisher
American Chemical Society (ACS)
Citation
Stoerzinger, Kelsey A., Wesley T. Hong, Gisele Azimi, Livia Giordano, Yueh-Lin Lee, Ethan J. Crumlin, Michael D. Biegalski, Hendrik Bluhm, Kripa K. Varanasi, and Yang Shao-Horn. “Reactivity of Perovskites with Water: Role of Hydroxylation in Wetting and Implications for Oxygen Electrocatalysis.” The Journal of Physical Chemistry C 119, no. 32 (August 13, 2015): 18504–18512.
Version
Author's final manuscript
Abstract
Oxides are instrumental to applications such as catalysis, sensing, and wetting, where the reactivity with water can greatly influence their functionalities. We find that the coverage of hydroxyls (*OH) measured at fixed relative humidity trends with the electron-donor (basic) character of wetted perovskite oxide surfaces. Using ambient pressure X-ray photoelectron spectroscopy, we report that the affinity toward hydroxylation, coincident with strong adsorption energies calculated for dissociated water and hydroxyl groups, leads to strong H bonding that is favorable for wetting while detrimental to catalysis of the oxygen reduction reaction (ORR). Our findings provide novel insights into the coupling between wetting and catalytic activity and suggest that catalyst hydrophobicity should be considered in aqueous oxygen electrocatalysis.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Massachusetts Institute of Technology. Department of Mechanical Engineering
Massachusetts Institute of Technology. Research Laboratory of Electronics
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DOI of Published Version
https://doi.org/10.1021/acs.jpcc.5b06621
