Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool
Name
27030749-MIT.pdf
Description
Full printable version
Size
5.41 MB
Format
Adobe PDF
Checksum (MD5)
0e1beccd8e67ea3e184203b3ee189cd6
Author(s)
Lee, Deishin
Advisor(s)
David H. Staelin and Roy E. Welsch.
Date Issued
1992
Publisher
Massachusetts Institute of Technology
Description
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, and (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1992.
Includes bibliographical references (leaf 59).
Subjects
Mechanical Engineering
Sloan School of Management
MIT Department
Sloan School of Management
Massachusetts Institute of Technology. Department of Mechanical Engineering
Terms of Use
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