Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles
Name
20m1335054.pdf
Description
Published version
Size
765.14 KB
Format
Adobe PDF
Checksum (MD5)
a548428a37c41c8cb2121ba9f4defd83
Author(s)
Dalirrooyfard, Mina
Vuong, Thuy Duong
Williams, Virginia Vassilevska
Date Issued
2021
Journal
SIAM Journal on Computing
Publisher
Society for Industrial & Applied Mathematics (SIAM)
Citation
Dalirrooyfard, Mina, Vuong, Thuy Duong and Williams, Virginia Vassilevska. 2021. "Graph Pattern Detection: Hardness for all Induced Patterns and Faster Noninduced Cycles." SIAM Journal on Computing, 50 (5).
Version
Final published version
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1137/20M1335054
