Repository logo
Log in(current)
Repository logoMIT Open ScholarshipDSpace@MIT
  1. Home
  2. Research Laboratory for Electronics (RLE)
  3. RLE Technical Reports
  4. Statistics of switching-time jitter for a tunnel diode threshold-crossing detector.

Statistics of switching-time jitter for a tunnel diode threshold-crossing detector.

Thumbnail Image
Download
Name

RLE-TR-456-04744903.pdf

Size

3.5 MB

Format

Adobe PDF

Checksum (MD5)

83111f1b7766b9649d093de41bb437f5

Date Issued
1967
Publisher
MIT Research Laboratory of Electronics
Series/Report no.
Technical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 456.
Description
Issued also as a Ph.D. Thesis in the Dept. of Electrical Engineering, 1966.
Bibliography: p.56.
MIT Department
Massachusetts Institute of Technology. Research Laboratory of Electronics
Persistent DSpace Link
http://hdl.handle.net/1721.1/4287
Repository logo
PrivacyPermissionsAccessibilityContact us
Repository logo
Notify us about copyright concerns.