Frequency domain multiplexing of force signals with application to magnetic resonance force microscopy
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Degen_Frequency domain.pdf
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Checksum (MD5)
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Author(s)
Degen, Christian
Poggio, M.
Oosterkamp, T. H.
Mamin, H. J.
Rugar, D.
Date Issued
February 2010
Journal
Applied Physical Letters
Publisher
American Institute of Physics
Citation
Oosterkamp, T. H. et al. “Frequency domain multiplexing of force signals with application to magnetic resonance force microscopy.” Applied Physics Letters 96.8 (2010): 083107-3. ©2010 American Institute of Physics.
Version
Final published version
Abstract
Frequency domain multiplexing, using an actively damped micromechanical cantilever, is used to detect multiple force signals simultaneously. The measurement principle is applied to magnetic resonance force microscopy to allow concurrent measurement of nuclear spin signals originating from distinct regions of the sample, or from multiple spin species.
MIT Department
Massachusetts Institute of Technology. Department of Chemistry
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1063/1.3304788
