Advantage of Machine Learning over Maximum Likelihood in Limited-Angle Low-Photon X-Ray Tomography
Name
2111.08011.pdf
Description
Accepted version
Size
431.62 KB
Format
Adobe PDF
Checksum (MD5)
fc14123cb28e8520027301d80f20c53c
Author(s)
Guo, Zhen
Song, Jung Ki
Barbastathis, George
Glinsky, Michael E
Vaughn, Courtenay T
Larson, Kurt W
Alpert, Bradley K
Levine, Zachary H
Date Issued
2022
Journal
Electronic Imaging
Publisher
Society for Imaging Science & Technology
Citation
Guo, Zhen, Song, Jung Ki, Barbastathis, George, Glinsky, Michael E, Vaughn, Courtenay T et al. 2022. "Advantage of Machine Learning over Maximum Likelihood in Limited-Angle Low-Photon X-Ray Tomography." Electronic Imaging, 34 (5).
Version
Author's final manuscript
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Terms of Use
Creative Commons Attribution-Noncommercial-Share Alike
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.2352/EI.2022.34.5.MLSI-202
