Zero-Crossing-Based Ultra-Low-Power A/D Converters
Name
Sodini_Zero-crossing-based.pdf
Size
3.42 MB
Format
Adobe PDF
Checksum (MD5)
4c702ef74e4fcb34e1e6cc24a9b2c434
Author(s)
Lee, Hae-Seung
Brooks, Lane
Sodini, Charles G.
Date Issued
November 2009
Journal
Proceedings of the IEEE
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Hae-Seung Lee, L. Brooks, and C.G. Sodini. “Zero-Crossing-Based Ultra-Low-Power A/D Converters.” Proceedings of the IEEE 98.2 (2010): 315–332. © Copyright 2010 IEEE
Version
Final published version
Abstract
Since the first demonstration of a comparator-based switched-capacitor circuit, analog-to-digital (A/D) converters based on virtual ground detection have made steady and significant progress. Comparators have been replaced by zero-crossing detectors, leading to the development of zero-crossing based circuits for faster speed and lower power. All facets of performance including the sampling rate, effective number of bits, noise floor, and figure-of-merit have improved substantially. This paper focuses on recent implementations of zero-crossing based A/D converters and discusses the technical issues unique to these A/D converters as well as solutions that have been developed to improve their performance and practicality. A series of prototype designs whose performance ranges from 8 bit, 200 MS/s to 12 bit, 50 MS/s are described. The ultimate low power potentials of these A/D converters are compared with various different types of complementary metal-oxide-semiconductor A/D converters from a fundamental thermal noise standpoint.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1109/jproc.2009.2032570
