Microgeometry capture using an elastomeric sensor
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Adelson_Microgeometry capture.pdf
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27.12 MB
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Author(s)
Johnson, Micah K.
Cole, Forrester
Raj, Alvin
Adelson, Edward H.
Date Issued
July 2011
Journal
ACM SIGGRAPH 2011 papers (SIGGRAPH '11)
Publisher
Association for Computing Machinery (ACM)
Citation
Micah K. Johnson, Forrester Cole, Alvin Raj, and Edward H. Adelson. 2011. Microgeometry capture using an elastomeric sensor. In ACM SIGGRAPH 2011 papers (SIGGRAPH '11), Hugues Hoppe (Ed.). ACM, New York, NY, USA, Article 46, 8 pages.
Version
Author's final manuscript
Abstract
We describe a system for capturing microscopic surface geometry. The system extends the retrographic sensor [Johnson and Adelson 2009] to the microscopic domain, demonstrating spatial resolution as small as 2 microns. In contrast to existing microgeometry capture techniques, the system is not affected by the optical characteristics of the surface being measured---it captures the same geometry whether the object is matte, glossy, or transparent. In addition, the hardware design allows for a variety of form factors, including a hand-held device that can be used to capture high-resolution surface geometry in the field. We achieve these results with a combination of improved sensor materials, illumination design, and reconstruction algorithm, as compared to the original sensor of Johnson and Adelson [2009].
MIT Department
Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
Massachusetts Institute of Technology. Department of Brain and Cognitive Sciences
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Creative Commons Attribution-Noncommercial-Share Alike
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DOI of Published Version
https://doi.org/10.1145/1964921.1964941
