Blackbox polynomial identity testing for depth 3 circuits
Name
Kayal-2009-Blackbox polynomial identity testing for depth 3 circuits.pdf
Size
312.34 KB
Format
Adobe PDF
Checksum (MD5)
89f4f83b8b34029fc3eac83116b33787
Author(s)
Kayal, Neeraj
Saraf, Shubhangi
Date Issued
March 2010
Journal
50th Annual IEEE Symposium on Foundations of Computer Science, 2009. FOCS '09
Publisher
Institute of Electrical and Electronics Engineers
Citation
Kayal, N., and S. Saraf. “Blackbox Polynomial Identity Testing for Depth 3 Circuits.” Foundations of Computer Science, 2009. FOCS '09. 50th Annual IEEE Symposium on. 2009. 198-207. © 2009 Institute of Electrical and Electronics Engineers.
Version
Final published version
Abstract
We study EIIE(k) circuits, i.e., depth three arithmetic
circuits with top fanin k. We give the first deterministic polynomial
time blackbox identity test for EIIE(k) circuits over the field Q of
rational numbers, thus resolving a question posed by Klivans and
Spielman (STOC 2001).
Subjects
Arithmetic circuits
Derandomization
Sylvester–Gallai Theorem
MIT Department
Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1109/FOCS.2009.67
