Methods for measuring work surface illuminance in adaptive solid state lighting networks
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Paradiso_Methods for.pdf
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Author(s)
Lee, Byungkun
Aldrich, Matthew Henry
Lee, ByungKun
Paradiso, Joseph A
Date Issued
September 2011
Journal
Proceedings of SPIE--the International Society for Optical Engineering; v.8123
Publisher
SPIE
Citation
Lee, Byungkun, Matthew Aldrich, and Joseph A. Paradiso. “Methods for measuring work surface illuminance in adaptive solid state lighting networks.” In Eleventh International Conference on Solid State Lighting, edited by Matthew H. Kane, Christian Wetzel, and Jian-Jang Huang, 81230V-81230V-10. SPIE - International Society for Optical Engineering, 2011.
Version
Author's final manuscript
Abstract
The inherent control flexibility implied by solid-state lighting - united with the rich details offered by sensor networks - prompts us to rethink lighting control. In this research, we propose several techniques for measuring work surface illuminance and ambient light using a sensor network. The primary goal of this research is to measure work surface illuminance without distraction to the user. We discuss these techniques, including the lessons learned from our prior research. We present a new method for measuring the illuminance contribution of an arbitrary luminaire at the work surface by decomposing the modulated light into its fundamental and harmonic components.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Media Laboratory
Massachusetts Institute of Technology. Responsive Environments Group
Program in Media Arts and Sciences (Massachusetts Institute of Technology)
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Creative Commons Attribution-Noncommercial-Share Alike 3.0
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DOI of Published Version
https://doi.org/10.1117/12.893562
