Dynamic modulation of material properties by solid state proton gating
Name
1117775571-MIT.pdf
Size
8.03 MB
Format
Adobe PDF
Checksum (MD5)
8b61b00f6a6a0e8cff94b301edb89a79
Author(s)
Tan, Aik Jun.
Advisor(s)
Geoffrey S. D. Beach.
Date Issued
2019
Publisher
Massachusetts Institute of Technology
Abstract
As functionalities become more abundant in solid state devices, one key capability which remains lacking is an effective means to dynamically tune material properties. In this thesis, we establish a pathway towards this capability by utilizing the simplest ion known to mankind: the proton. We demonstrate for the first time dynamic control of magnetic properties in an all-solid-state heterostructures using solid state proton gating in a metal/oxide heterostructure. We also demonstrate dynamic modulation of magnetic anisotropy at a metal-metal interface through hydrogen insertion in a heavy metal adjacent to a ferromagnet. Besides magnetic properties, solid state proton gating also enables dynamic modulation of optical properties in a thin film oxide. We observe fast gating of optical reflectivity by ~10% at timescale down to ~20ms in a metal/oxide/metal heterostructure. Finally, we also demonstrate a room temperature reversible solid oxide fuel cell based on hydrogen storage. The cell has a small form factor which is suitable for energy storage in solid state microelectronics application. Our work hence provides a platform for complete control of material properties through solid state proton gating.
Description
This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Materials Science and Engineering, 2019
Cataloged from student-submitted PDF version of thesis.
Includes bibliographical references (pages 195-215).
Subjects
Materials Science and Engineering.
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Terms of Use
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