Broad-band soft X-ray polarimetry
Name
Marshall-2010-Broadband soft x-ray polarimetry.pdf
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330.65 KB
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Author(s)
Schulz, Norbert S.
Murphy, Kendrah Dawn
Marshall, Herman
Heilmann, Ralf K
Date Issued
July 2010
Journal
Proceedings of SPIE--the International Society for Optical Engineering
Publisher
SPIE
Citation
Herman L. Marshall, Ralf K. Heilmann, Norbert S. Schulz and Kendrah D. Murphy, "Broadband soft x-ray polarimetry", Proc. SPIE 7732, 77320F (2010); doi:10.1117/12.857443 © 2010 SPIE
Version
Final published version
Abstract
We developed an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics, using a method previously described by Marshall (2008) involving laterally graded, multilayer-coated flat mirrors. We present possible science investigations with such an instrument and two possible configurations. This instrument could be used in a small orbiting mission or scaled up for the International X-ray Observatory. Laboratory work has begun that would demonstrate the capabilities of key components.
MIT Department
MIT Kavli Institute for Astrophysics and Space Research
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1117/12.857443
