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Focal plane instrumentation for the Wide-Field X-ray Telescope

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Author(s)
Bautz, Marshall W.
•
Foster, Richard F.
•
Murray, Stephen S.
•
WFXT Team
Date Issued
June 2010
Journal
Proceedings of SPIE--the International Society for Optical Engineering ; v. 7732
Publisher
Institute of Electrical and Electronics Engineers
Citation
Bautz, M. W., R. F. Foster, and S. S. Murray. “Focal plane instrumentation for the Wide-Field X-ray Telescope.” Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray. Ed. Monique Arnaud, Stephen S. Murray, & Tadayuki Takahashi. San Diego, California, USA: SPIE, 2010. 77324G-6. ©2010 SPIE.
Version
Final published version
Abstract
The three X-ray imaging focal planes of the Wide-Field X-ray Telescope (WFXT) Mission will each have a field of view up to 1 degree square, pixel pitch smaller than 1 arcsec, excellent X-ray detection efficiency and spectral resolving power near the theoretical limit for silicon over the 0.2 - 6 keV spectral band. We describe the baseline concept for the WFXT focal planes. The detectors are derived from MIT Lincoln Laboratory CCDs currently operating in orbit on Chandra and Suzaku. Here we describe the baseline WFXT focal plane instrumentation and briefly consider options for alternative detector technologies.
MIT Department
MIT Kavli Institute for Astrophysics and Space Research
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
http://hdl.handle.net/1721.1/61425
DOI of Published Version
https://doi.org/10.1117/12.857803
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