Noninvasive electron microscopy with interaction-free quantum measurements
Name
Putman-2009-Noninvasive.pdf
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257.16 KB
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Adobe PDF
Checksum (MD5)
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Author(s)
Putnam, William P.
Yanik, Mehmet Fatih
Date Issued
October 2009
Journal
Physical Review A
Publisher
American Physical Society
Citation
Putnam, William P., and Mehmet Fatih Yanik. “Noninvasive electron microscopy with interaction-free quantum measurements.” Physical Review A 80.4 (2009): 040902. © 2009 The American Physical Society
Version
Final published version
Abstract
We propose the use of interaction-free quantum measurements with electrons to eliminate sample damage in electron microscopy. This might allow noninvasive molecular-resolution imaging. We show the possibility of such measurements in the presence of experimentally measured quantum decoherence rates and using a scheme based on existing charged particle trapping techniques.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
http://dx.doi.org/10.1103/PhysRevA.80.040902
