Choriocapillaris Loss in Advanced Age-Related Macular Degeneration
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Author(s)
Moreira-Neto, Carlos A.
Waheed, Nadia K.
Ferrara, Daniela
Moult, Eric Michael
Fujimoto, James G
Date Issued
January 2018
Journal
Journal of Ophthalmology
Publisher
Hindawi Publishing Corporation
Citation
Moreira-Neto, Carlos A. et al. "Choriocapillaris Loss in Advanced Age-Related Macular Degeneration." Journal of Ophthalmology 2018 (January 2018): 8125267 © 2018 Carlos A. Moreira-Neto et al
Version
Final published version
Abstract
The purpose of this review is to summarize the current knowledge on choriocapillaris loss in advanced age macular degeneration (AMD). Several histopathological studies in animal models and human eyes had showed that the choriocapillaris density decreases with age. However, the role of choriocapillaris loss is still unclear in AMD and its advanced forms, either choroidal neovascularization (CNV) or geographic atrophy (GA). Some authors have hypothesized that choriocapillaris loss might precede overt retinal pigment epithelium atrophy. Others have hypothesized that deposition of complement complexes on and around the choriocapillaris could be related to the tissue loss observed in early AMD. The development of imaging modalities, such as optical coherence tomography angiography (OCTA), have led to a better understanding of underlying physiopathological mechanisms in AMD. OCTA showed atrophy of choriocapillaris underneath and beyond the region of photoreceptors and RPE loss, in agreement with previous histopathologic studies. The evolution of OCTA technology suggests that CNV seems to originate from regions of severe choriocapillaris alteration. Significant progress has been made in the understanding of development and progression of GA and CNV. In vivo investigation of the choriocapillaris using OCTA may lead to new insights related to underlying disease mechanisms in AMD.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Research Laboratory of Electronics
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DOI of Published Version
https://doi.org/10.1155/2018/8125267
