Novel fabrication and optoelectronic property of semiconductor filaments by optical-fiber thermal drawing
Name
Deng-2009-Novel fabrication and optoelectronic property of semiconductor filaments by optical-fiber thermal drawing.pdf
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Author(s)
Deng, D. S.
Orf, Nicholas D.
Abouraddy, Ayman F.
Fink, Yoel
Date Issued
August 2009
Journal
Proceedings of SPIE--the International Society for Optical Engineering
Publisher
Society of Photo-optical Instrumentation Engineers
Citation
Deng, D. S. et al. “Novel fabrication and optoelectronic property of semiconductor filaments by optical-fiber thermal drawing.” Nanoengineering: Fabrication, Properties, Optics, and Devices VI. Ed. Elizabeth A. Dobisz & Louay A. Eldada. San Diego, CA, USA: SPIE, 2009. 740204-3. © 2009 SPIE
Version
Final published version
Abstract
One dimensional nanostructure such as nanowires is typically fabricated by the wafer-based approach. Here we report nanowires are fabricated by thermal drawing of fiber. A thin viscous semiconductor film internal to the fiber undergoes filamentation driven by a fluid instability while retaining longitudinal structural integrity. Arrays of centimeter-long crystalline nanowires by post-drawing crystallization process are electrically contacted and yield a two-order-of-magnitude change in conductivity between dark and illuminated states. These results hold promise for the nanowire-detector arrays that may be integrated with large-area electronics.
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Massachusetts Institute of Technology. Research Laboratory of Electronics
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
http://dx.doi.org/10.1117/12.827379
