Tests for the elliptical symmetry of hyperspectral imaging data
Name
Niu-2010-Tests for the elliptical symmetry of hyperspectral imaging data.pdf
Size
3.14 MB
Format
Adobe PDF
Checksum (MD5)
28ac4da99451da301c92a47367189eeb
Author(s)
Niu, Sidi
Ingle, Vinay K.
Manolakis, Dimitris G.
Cooley, Thomas W.
Date Issued
August 2010
Journal
Proceedings of SPIE--the International Society for Optical Engineering
Publisher
SPIE
Citation
Sidi Niu, Vinay K. Ingle, Dimitris G. Manolakis and Thomas W. Cooley, "Tests for the elliptical symmetry of hyperspectral imaging data", Proc. SPIE 7812, 78120D (2010); doi:10.1117/12.861055 © 2010 COPYRIGHT SPIE
Version
Final published version
Abstract
Accurate statistical models for hyperspectral imaging (HSI) data distribution are useful for many applications. A family of elliptically contoured distribution (ECD) has been investigated to model the unimodal ground cover classes. In this paper we propose to test the elliptical symmetry of real unimodal HSI clutters which will answer the question whether the family of ECD will provide an appropriate model for HSI data. We emphasize that the elliptical symmetry is an inherent feature shared by all ECDs. It is a prerequisite that real HSI clutters must pass these elliptical symmetry tests, so that the family of ECD can be qualified to model these data accurately.
MIT Department
Lincoln Laboratory
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1117/12.861055
