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12.141 Electron Microprobe Analysis, January (IAP) 2003

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Author(s)
Chatterjee, Nilanjan
•
Grove, Timothy L.
Alternative Title
Electron Microprobe Analysis
Date Issued
January 2003
Abstract
Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions involve hands-on use of the electron microprobe.
Subjects
x-ray microanalysis
electron microprobe
ZAF matrix corrections
wavelength and energy dispersive spectrometry
scanning backscattered electron
secondary electron
cathodoluminescence
X-ray imaging
Microprobe analysis
MIT Department
Massachusetts Institute of Technology. Department of Earth, Atmospheric, and Planetary Sciences
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