Hot-carrier reliability assessment in CMOS digital integrated circuits
Name
40336257-MIT.pdf
Description
Full printable version
Size
11.74 MB
Format
Adobe PDF
Checksum (MD5)
949a4f4d33fcf01d8f445bc2facb191a
Author(s)
Jiang, Wenjie, 1963-
Advisor(s)
James E. Chung.
Date Issued
1998
Publisher
Massachusetts Institute of Technology
Description
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.
Includes bibliographical references.
Subjects
Electrical Engineering and Computer Science
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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