The effects of noise on measurements made in a distributed parameter system.
Name
24171350-MIT.pdf
Description
Full printable version
Size
1.33 MB
Format
Adobe PDF
Checksum (MD5)
03c34022aa5c2a479c0d42d303b0809b
Author(s)
Hersh, Rodney Robert
Advisor(s)
Leonard A. Gould.
Date Issued
1972
Publisher
Massachusetts Institute of Technology
Description
Massachusetts Institute of Technology. Dept. of Electrical Engineering. Thesis. 1972. M.S.
MICROFICHE COPY ALSO AVAILABLE IN BARKER ENGINEERING LIBRARY.
Bibliography: leaf 47.
Subjects
Electrical Engineering
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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