Fabrication and I-V Characterization of ZnO Nanorod Based Metal-Insulator-Semiconductor Junction
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AMMNS006.pdf
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606.82 KB
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Author(s)
Quang, Le Hong
Chua, Soo-Jin
Fitzgerald, Eugene A.
Date Issued
January 2006
Series/Report no.
Advanced Materials for Micro- and Nano-Systems (AMMNS)
Abstract
We report on the characteristics of a ZnO based metal insulator semiconductor (MIS) diode comprised of a heterostructure of n-ZnO nanorods/n-GaN. The MIS structure consisted of unintentional - doped n type ZnO nanorods grown on n-GaN sample using hydrothermal synthesis at low temperature (100°). The ZnO nanorod layer was vertically grown from the GaN sample, having the diameter 100nm and length 2µm. Then, an insulator layer for electrical isolation was deposited on the top of ZnO nanorod layer by using spin coating method. A metal layer (gold) was finally deposited on the top. The I-V dependences show a rectifying diode like behavior with a leakage current of 2.10⁻⁵ A and a threshold voltage of about 3V. Depend on the thickness of the insulator, the I-V dependences of the n-ZnO/n-GaN heterostructure was varied from rectifying behavior to Ohmic and nearly linear.
Subjects
Gallium Nitride
Metal Insulator Semiconductor structure
Nanostructure
Zinc compounds
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