Measurement of the B- lifetime using a simulation free approach for trigger bias correction
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Aaltonen-2011-Measurement of the B.pdf
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Author(s) • • • •
Gomez-Ceballos, Guillelmo
Goncharov, Maxim
Makhoul, Khaldoun
Paus, Christoph M. E.
Bauer, Gerry P
Date Issued
February 2011
Journal
Physical review D
Publisher
American Physical Society
Citation
Aaltonen, T. et al. “Measurement of the B- lifetime using a simulation free approach for trigger bias correction.” Physical Review D 83.3 (2011) : n. pag. © 2011 American Physical Society
Version
Final published version
Abstract
The collection of a large number of B-hadron decays to hadronic final states at the CDF II Detector is possible due to the presence of a trigger that selects events based on track impact parameters. However, the nature of the selection requirements of the trigger introduces a large bias in the observed proper-decay-time distribution. A lifetime measurement must correct for this bias, and the conventional approach has been to use a Monte Carlo simulation. The leading sources of systematic uncertainty in the conventional approach are due to differences between the data and the Monte Carlo simulation. In this paper, we present an analytic method for bias correction without using simulation, thereby removing any uncertainty due to the differences between data and simulation. This method is presented in the form of a measurement of the lifetime of the B- using the mode B-→D0π- [B- →D superscript 0 pi-]. The B- lifetime is measured as τB-=1.663±0.023±0.015 ps [T subscript B-=1.663±0.023±0.015 ps], where the first uncertainty is statistical and the second systematic. This new method results in a smaller systematic uncertainty in comparison to methods that use simulation to correct for the trigger bias.
MIT Department
Massachusetts Institute of Technology. Department of Physics
Massachusetts Institute of Technology. Laboratory for Nuclear Science
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DOI of Published Version
https://doi.org/10.1103/PhysRevD.83.032008