Relating process measurements to customer dissatisfiers
Name
46925495-MIT.pdf
Description
Full printable version
Size
6.01 MB
Format
Adobe PDF
Checksum (MD5)
629d7a6b0d50c5cf68e49c03fbbe5e9f
Author(s)
Schaefer, Mark Stephen, 1972-
Advisor(s)
Roy E. Welsch and Daniel E. Whitney.
Date Issued
2000
Publisher
Massachusetts Institute of Technology
Description
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management, 2000.
Includes bibliographical references (p. 82).
Subjects
Electrical Engineering and Computer Science.
Sloan School of Management.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Sloan School of Management
Terms of Use
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