Scattering of long wavelengths into thin silicon photovoltaic films by plasmonic silver nanoparticles
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Author(s) • • • • • • • • •
Osgood, Richard M.
Bullion, K. M.
Giardini, S. A.
Carlson, J. B.
Stenhouse, P.
Jeffrey, F.
Braymen, S.
Gill, H. Singh
Kumar, J.
Kingsborough, Richard P.
Date Issued
October 2014
Journal
Proceedings of SPIE--the International Society for Optical Engineering
Publisher
SPIE
Citation
Osgood, R. M., K. M. Bullion, S. A. Giardini, J. B. Carlson, P. Stenhouse, R. Kingsborough, V. Liberman, et al. “Scattering of Long Wavelengths into Thin Silicon Photovoltaic Films by Plasmonic Silver Nanoparticles.” Edited by Oleg V. Sulima and Gavin Conibeer. Next Generation Technologies for Solar Energy Conversion V (October 3, 2014). © 2014 Society of Photo-Optical Instrumentation Engineers (SPIE).
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Final published version
Abstract
Nanoparticles and nanostructures with plasmonic resonances are currently being employed to enhance the efficiency of solar cells. Ag stripe arrays have been shown theoretically to enhance the short-circuit current of thin silicon layers. Monolayers of Ag nanoparticles with diameter d < 300 nm have shown strong plasmonic resonances when coated in thin polymer layers with thicknesses < d. We study experimentally the diffuse vs. specular scattering from monolayer arrays of Ag nanoparticles (spheres and prisms with diameters in the range 50 – 300 nm) coated onto the front side of thin (100 nm < t < 500 nm) silicon films deposited on glass and flexible polymer substrates, the latter originating in a roll-to-roll manufacturing process. Ag nanoparticles are held in place and aggregation is prevented with a polymer overcoat. We observe interesting wavelength shifts between maxima in specular and diffuse scattering that depend on particle size and shape, indicating that the nanoparticles substantially modify the scattering into the thin silicon film.
MIT Department
Massachusetts Institute of Technology. Institute for Soldier Nanotechnologies
Lincoln Laboratory
Massachusetts Institute of Technology. Department of Mathematics
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DOI of Published Version
https://doi.org/10.1117/12.2062268