Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Name
jove-protocol-54408-applying-x-ray-imaging-crystal-spectroscopy-for-use-as-high.pdf
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Author(s) • •
Cao, Norman
Mier, Andres M.
Rice, John E.
Date Issued
August 2016
Journal
Journal of Visualized Experiments
Publisher
MyJoVE Corporation
Citation
Cao, Norman M., et al. “Applying X-Ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic.” Journal of Visualized Experiments 114 (August 2016) © 2016 Journal of Visualized Experiments
Version
Final published version
Abstract
X-ray spectra provide a wealth of information on high temperature plasmas; for example electron temperature and density can be inferred from line intensity ratios. By using a Johann spectrometer viewing the plasma, it is possible to construct profiles of plasma parameters such as density, temperature, and velocity with good spatial and time resolution. However, benchmarking atomic code modeling of X-ray spectra obtained from well-diagnosed laboratory plasmas is important to justify use of such spectra to determine plasma parameters when other independent diagnostics are not available. This manuscript presents the operation of the High Resolution X-ray Crystal Imaging Spectrometer with Spatial Resolution (HIREXSR), a high wavelength resolution spatially imaging X-ray spectrometer used to view hydrogen- and helium-like ions of medium atomic number elements in a tokamak plasma. In addition, this manuscript covers a laser blow-off system that can introduce such ions to the plasma with precise timing to allow for perturbative studies of transport in the plasma. Keywords: Engineering, Issue 114, X-Ray Spectroscopy, Crystal Spectroscopy, Plasma Physics, Fusion, Tokamaks, Plasma Diagnostics
MIT Department
Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
Massachusetts Institute of Technology. Department of Physics
Massachusetts Institute of Technology. Plasma Science and Fusion Center
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.3791/54408