Probing Nanoscale Heat and Force Interactions Using Atomic Force Microscopes (AFM)
Author(s)
Chen, Gang
Shen, Sheng
Mavrokefalos, Anastassios
Sambegoro, Poetro Lebdo
Date Issued
November 19, 2018
Journal
2010 14th International Heat Transfer Conference, Volume 6
Publisher
Begell House
Citation
Shen, Sheng, Anastassios Mavrokefalos, Poetro Sambegoro, and Gang Chen. “Probing Nanoscale Heat and Force Interactions Using Atomic Force Microscopes (AFM).” 2010 14th International Heat Transfer Conference, Volume 6 (2010).
Version
Final published version
Abstract
Many devices and instruments such as magnetic hard disk drives and atomic force microscopes (AFM) rely on the stable operation of their small probing heads at nanoscale gaps. Due to the small scale of the probing heads, the force interactions (Casimir force and electrostatic force) between the small probes and the surrounding become more significant. The local heating caused by read/write electric currents in hard disk drives or probing laser beams in AFM on the probes inevitably leads to the heat transfer between them and the surrounding. The nanoscale heat and force interactions play a critical role in the performances of those instruments. In this paper, we use a bimaterial AFM cantilever to measure the nanoscale air heat conduction, radiation and force between a microsphere and a substrate. The resulting "heat transfer-distance" and "force-distance" curves clearly show the strong dependence of nanoscale interactions with gap distances.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
MIT Energy Initiative
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1115/IHTC14-23329
