Repository logo
Log in(current)
Repository logoMIT Open ScholarshipDSpace@MIT
  1. Home
  2. MIT Open Access Articles
  3. MIT Open Access Articles
  4. A low-voltage energy-sampling IR-UWB digital baseband employing quadratic correlation

A low-voltage energy-sampling IR-UWB digital baseband employing quadratic correlation

Thumbnail Image
Download
Name

Mercier-2009-A 0.55V 16Mbs 1.6mW non-coherent IR-UWB digital baseband with 1ns synchronization accuracy.pdf

Size

1.35 MB

Format

Adobe PDF

Checksum (MD5)

43bae865bb9585c2a55f28115ab6d709

Author(s)
Chandrakasan, Anantha P.
•
Mercier, Patrick Philip
•
Bhardwaj, Manish
•
Daly, Denis C.
Date Issued
June 2010
Journal
IEEE Journal of Solid-State Circuits
Publisher
Institute of Electrical and Electronics Engineers
Citation
Mercier, P.P. et al. “A Low-Voltage Energy-Sampling IR-UWB Digital Baseband Employing Quadratic Correlation.” Solid-State Circuits, IEEE Journal of 45.6 (2010): 1209-1219. ©2010 IEEE.
Version
Final published version
Abstract
This paper describes a digital baseband designed for use in a non-coherent IR-UWB system. Owing to the nonlinear statistics introduced by the energy-sampling RF front-end, the baseband employs a new quadratic correlation technique that achieves comparable performance to a matched filter classifier, with the added benefit of being robust to SNR estimation errors. Additionally, “alias-free codes” are introduced that allow for pulse-level synchronization accuracy without requiring any increase in front-end complexity. Fabricated in a 90 nm CMOS process, the digital baseband utilizes significant parallelism in addition to clock and data gating to achieve low-power operation, with supply voltages as low as 0.55 V. At a clock frequency of 32 MHz, the baseband requires 14-to-79 μs to process a preamble during which it consumes an average power of 1.6 mW, while payload demodulation requires 12 pJ/bit.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Microsystems Technology Laboratories
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
http://hdl.handle.net/1721.1/59998
DOI of Published Version
https://doi.org/10.1109/JSSC.2010.2046245
Repository logo
PrivacyPermissionsAccessibilityContact us
Repository logo
Notify us about copyright concerns.