Single-frame far-field diffractive imaging with randomized illumination
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oe-28-25-37103.pdf
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12.51 MB
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Adobe PDF
Checksum (MD5)
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Author(s)
Levitan, Abraham
Keskinbora, Kahraman
Sanli, Umut T.
Weigand, Markus
Comin, Riccardo
Date Issued
November 2020
Journal
Optics Express
Publisher
The Optical Society
Citation
Levitan, Abraham et al. "Single-frame far-field diffractive imaging with randomized illumination." Optics Express 28, 25 (November 2020): 37103-37117 © 2020 Optical Society of America
Version
Final published version
Abstract
We introduce a single-frame diffractive imaging method called randomized probe imaging (RPI). In RPI, a sample is illuminated by a structured probe field containing speckles smaller than the sample’s typical feature size. Quantitative amplitude and phase images are then reconstructed from the resulting far-field diffraction pattern. The experimental geometry of RPI is straightforward to implement, requires no near-field optics, and is applicable to extended samples. When the resulting data are analyzed with a complimentary algorithm, reliable reconstructions which are robust to missing data are achieved. To realize these benefits, a resolution limit associated with the numerical aperture of the probe-forming optics is imposed. RPI therefore offers an attractive modality for quantitative X-ray phase imaging when temporal resolution and reliability are critical but spatial resolution in the tens of nanometers is sufficient. We discuss the method, introduce a reconstruction algorithm, and present two proof-of-concept experiments: one using visible light, and one using soft X-rays.
MIT Department
Massachusetts Institute of Technology. Department of Physics
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1364/oe.397421
