Characterization of hot-carrier reliability in analog sub-circuit design
Name
35334375-MIT.pdf
Description
Full printable version
Size
7.71 MB
Format
Adobe PDF
Checksum (MD5)
dbb66679c30b6ebc7e12fc3f430a1340
Author(s)
Le, Huy X. P
Advisor(s)
James E. Chung.
Date Issued
1996
Publisher
Massachusetts Institute of Technology
Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
Includes bibliographical references (leaves 52-54).
Subjects
Electrical Engineering and Computer Science
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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